A compact, fast, wide-field imaging spectrometer system

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8032, Issue , 2011, Pages

  Mouroulis, Pantazis ^a   Van Gorp, Byron E ^a   White, Victor E ^a   Mumolo, Jason M ^a   Hebert, Daniel ^b   Feldman, Martin ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

Diffraction grating; Dyson spectrometer; Imaging spectrometry; X ray lithography

Indexed keywords

DYSON SPECTROMETER; FIELD OF VIEWS; GRAY SCALE; IMAGING SPECTROMETERS; IMAGING SPECTROMETRY; INGAAS DETECTORS; SPATIAL UNIFORMITY; TEST RESULTS; TWO-MIRROR TELESCOPE; WAVELENGTH REGIONS; WIDE FIELD IMAGING;

DIFFRACTION; DIFFRACTION GRATINGS; SPECTROMETRY; X RAY LITHOGRAPHY;

SPECTROMETERS;

EID: 79960539623     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.882706     Document Type: Conference Paper

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