Solid-state fault isolation devices: Application to future power electronics-based distribution systems

IET Electric Power Applications

Volumn 5, Issue 6, 2011, Pages 521-528

  Vodyakho, O ^a   Steurer, M ^a   Neumayr, D ^a   Edrington, C S ^a   Karady, G ^b   Bhattacharya, S ^c  

^a FLORIDA STATE UNIVERSITY   (United States)

^b AZ 85281   (United States)

^c North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCEPTABLE LIMIT; CIRCUIT BREAKER OPERATION; CONVENTIONAL CIRCUITS; DISTRIBUTION SYSTEMS; FAULT ISOLATION; MEDIUM VOLTAGE; OPERATIONAL ISSUES; OVER-VOLTAGES; PASSIVE CLAMPING; POWER ELECTRONIC CONVERTERS; SELECTION CRITERIA; SEMICONDUCTOR CIRCUITS; TEST CIRCUIT; VOLTAGE DISTURBANCES;

CAPACITANCE; CIRCUIT BREAKING ARCS; ELECTRIC CIRCUIT BREAKERS; ELECTROLYSIS; ENGINEERING RESEARCH; LOCAL AREA NETWORKS; POWER ELECTRONICS;

SOLID STATE DEVICES;

EID: 79960520892     PISSN: 17518660     EISSN: 17518679     Source Type: Journal    
DOI: 10.1049/iet-epa.2010.0258     Document Type: Article

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