Astrometry with the MCAO instrument MAD: An analysis of single-epoch data obtained in the layer-oriented mode

Astronomy and Astrophysics

Volumn 532, Issue , 2011, Pages

  Meyer, E ^a,b   Kurster M ^a   Arcidiacono, C ^c,d   Ragazzoni, R ^c   Rix, H W ^a  

^a MAX PLANCK INSTITUT FÜR ASTRONOMIE   (Germany)

^b LEIDEN UNIVERSITY   (Netherlands)

^c INAF OSSERVATORIO ASTRONOMICO DI PADOVA   (Italy)

^d INAF OSSERVATORIO ASTROFISICO DI ARCETRI   (Italy)

Author keywords

Astrometry; Instrumentation: adaptive optics; Methods: observational; Techniques: image processing

Indexed keywords

ASTROMETRIC PRECISION; ASTROMETRY; DATA SETS; DENSE CLUSTERS; DETECTOR FLUXES; DISTORTION CORRECTION; EXOPLANET DETECTION; GLOBULAR CLUSTERS; IMAGING DATA; INSTRUMENT DEVELOPMENT; INSTRUMENTATION: ADAPTIVE OPTICS; LARGE FIELD OF VIEWS; LARGER FIELDS; METHODS:OBSERVATIONAL; MULTI-CONJUGATED ADAPTIVE OPTICS; TECHNIQUES: IMAGE PROCESSING; TWO LAYERS;

IMAGE PROCESSING; JITTER; OPTICAL DATA PROCESSING; OPTICS; STARS;

INSTRUMENTS;

EID: 79960420073     PISSN: 00046361     EISSN: 14320746     Source Type: Journal    
DOI: 10.1051/0004-6361/201016053     Document Type: Article

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