Comparative evaluation of expert system testing methods

Proceedings - International Conference on Tools with Artificial Intelligence, ICTAI

Volumn 1992-November, Issue , 1992, Pages 334-341

  Kirani, S ^a   Zualkernan, I A ^a   Tsai, W T ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; EXPERT SYSTEMS; LIFE CYCLE; TESTING;

BLACK BOXES; COMPARATIVE EVALUATIONS; DIAGNOSTIC EXPERT SYSTEM; EFFECTIVE TESTING; MUTATION TESTING; SYSTEM TESTING; TESTING METHOD; VLSI MANUFACTURING;

BLACK-BOX TESTING;

EID: 79960303882     PISSN: 10823409     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TAI.1992.246425     Document Type: Conference Paper

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