Source-trap characterization of thermally transferred OSL in quartz

Journal of Physics D: Applied Physics

Volumn 44, Issue 29, 2011, Pages

  Shen, Z X ^a   Mauz, B ^b   Lang, A ^b  

^a Tulane University   (United States)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY FACTORS; LOW-INTENSITY; MEAN LIFETIME; OPTICAL BLEACHING; OPTICALLY STIMULATED LUMINESCENCE; QUARTZ OSL; TECHNIQUES USED; THERMAL TRANSFER; THERMALLY TRANSFERRED OSL; TRANSFER MECHANISMS;

BLEACHING; CLEANING; ELECTRON TRAPS; ELECTRONS; HEATING; THERMOLUMINESCENCE;

QUARTZ;

EID: 79960275546     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/29/295405     Document Type: Article

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