Al effect in transport properties of nickel oxide and its relevance to the oxidation of nickel

Materials Science and Engineering: B

Volumn 176, Issue 13, 2011, Pages 1002-1009

  Halem, N ^a   Abrudeanu, M ^b   Petot Ervas, G ^c  

^a UNIVERSITÉ MOULOUD MAMMERI   (Algeria)

^b UNIVERSITY OF PITESTI   (Romania)

^c ECOLE CENTRALE PARIS   (France)

Author keywords

Diffusion; Electrical conductivity; Kinetic demixing; NiO and Al doped NiO single crystals; Oxidation kinetics; Point defects

Indexed keywords

BINARY ALLOYS; DIFFUSION; GRAIN BOUNDARIES; KINETICS; OXIDATION; POINT DEFECTS; TRANSPORT PROPERTIES;

AL EFFECT; AL-DOPED; DRIVING FORCES; ELECTRICAL CONDUCTIVITY; KINETIC DEMIXING; NIO AND AL-DOPED NIO SINGLE CRYSTAL; OXIDATION BEHAVIOURS; OXIDATION KINETICS; OXIDE SCALE; PROPERTIES OF AL;

NICKEL OXIDE;

EID: 79960208171     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2011.05.035     Document Type: Article

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