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Volumn 44, Issue 8, 2011, Pages 1349-1360

Graphic supervisory control of an automatic optical inspection for LED properties

Author keywords

Automatic optical inspection (AOI); Charge coupled device (CCD); Graphic supervisory control; Light emitting diode (LED)

Indexed keywords

ANALOG INPUTS; AUTOMATED OPTICAL INSPECTION SYSTEMS; AUTOMATIC OPTICAL INSPECTION; CHARGE COUPLED DEVICE (CCD); CHARGE COUPLED DEVICE CAMERA; DARK ROOM; FORWARD VOLTAGE; IMAGING INSPECTION; INSPECTION PROCESS; LABVIEW SOFTWARE; LIGHT EMITTING DIODE (LED); OPTICAL INSPECTION; PLATFORM CONTROL; PNEUMATIC CYLINDERS; SUPERVISORY CONTROL; SYSTEM CHARACTERISTICS;

EID: 79960164328     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.measurement.2011.04.003     Document Type: Article
Times cited : (13)

References (9)
  • 1
    • 79960164085 scopus 로고    scopus 로고
    • Development of LED electric-optical properties measurement system
    • Y.C. Lai, J.Y. Huang, and N.T. Chen Development of LED electric-optical properties measurement system J Illum Eng 24 2007 48 57
    • (2007) J Illum Eng , vol.24 , pp. 48-57
    • Lai, Y.C.1    Huang, J.Y.2    Chen, N.T.3
  • 2
    • 33646859006 scopus 로고    scopus 로고
    • Automated optical quality inspection of light emitting diodes
    • B. Miran, P. Franjo, and L. Bostjan Automated optical quality inspection of light emitting diodes Meas. Sci. Technol. 17 2006 1372 1378
    • (2006) Meas. Sci. Technol. , vol.17 , pp. 1372-1378
    • Miran, B.1    Franjo, P.2    Bostjan, L.3
  • 3
    • 60349115513 scopus 로고    scopus 로고
    • The implementation and application of programming port communication between industry PC and Mitsubishi FX series PLC
    • J. Sun, P. Lu, Y. Fu, L. Chen, The implementation and application of programming port communication between industry PC and Mitsubishi FX series PLC, in: Proc. 3rd Int. Conf. on Intelligent System and Knowledge Engineering, vol. 1, 2008, pp 1324-7.
    • (2008) Proc. 3rd Int. Conf. on Intelligent System and Knowledge Engineering , vol.1 , pp. 1324-1327
    • Sun, J.1    Lu, P.2    Fu, Y.3    Chen, L.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.