Self-focusing collapse distance in ultrashort pulses and measurement of nonlinear index

Optics Letters

Volumn 36, Issue 13, 2011, Pages 2542-2544

  Whalen, P ^a   Moloney, J V ^a   Kolesik, M ^a,b  

^a UNIVERSITY OF ARIZONA   (United States)

^b Constantine the Philosopher University ^*  (Slovakia)

Author keywords

[No Author keywords available]

Indexed keywords

COLLAPSE DISTANCE; CRITICAL POWER; DEFOCUSING; FREE ELECTRON; MEASURED DATA; NONLINEAR INDEX; SELF-FOCUSING; SEMI-ANALYTICAL MODEL;

COMPUTER SIMULATION;

NUMERICAL METHODS;

EID: 79959961019     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.36.002542     Document Type: Article

References (6)

1. W. Liu and S. L. Chin, Opt. Express 13, 5750 (2005).
2. J. Bernhardt, P. Simard, W. Liu, H. Xu, F. Theberge, A. Azarm, J. Daigle, and S. Chin, Opt. Commun. 281, 2248 (2008).
3. D. E. Laban, W. C. Wallace, R. D. Glover, R. T. Sang, and D. Kielpinski, Opt. Lett. 35, 1653 (2010).
4. M. Kolesik and J. V. Moloney, Phys. Rev. E 70, 036604 (2004).
5. A. Couairon and A. Mysyrowicz, Phys. Rep. 441, 47 (2007).
6. J. Kasparian, R. Sauerbrey, and S. L. Chin, Appl. Phys. B 71, 877 (2000).