SCOPUS 정보 검색 플랫폼

Volumn 85, Issue 2, 2011, Pages 1225-1228

Use of 3-D plots to avoid mutual interference in bianalyte ASV determinations: Application to cadmium and lead detection

(5) Wongkaew, Nongnoot a Guajardo, Cristian a Rijiravanich, Patsamon a Somasundrum, Mithran a Surareungchai, Werasak a

a KING MONGKUT'S UNIVERSITY OF TECHNOLOGY THONBURI (Thailand)

Author keywords

Anodic stripping voltammetry; Bismuth film; Cadmium; Lead; Screen printed electrode

Indexed keywords

BISMUTH PLATING; CADMIUM; CURVE FITTING; ELECTRODES; LEAD; VOLTAMMETRY;

ANODIC STRIPPING VOLTAMMETRY; BIANALYTE; BISMUTH FILM; CADMIUM AND LEADS; CALIBRATION PLOT; MUTUAL INTERFERENCE; NONLINEAR FITTING; SCREEN PRINTED ELECTRODES;

CHEMICAL DETECTION;

EID: 79959942241 PISSN: 00399140 EISSN: None Source Type: Journal
DOI: 10.1016/j.talanta.2011.05.024 Document Type: Article

Times cited : (3)

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