The non-volatile memory industry - A personal journey

2011 3rd IEEE International Memory Workshop, IMW 2011

Volumn , Issue , 2011, Pages

  Harari, Eli ^a  

^a NONE

Author keywords

Eli Harari; flash memory; SanDisk

Indexed keywords

ELI HARARI; NON-VOLATILE MEMORIES; PERSONAL INVOLVEMENT; SANDISK;

FLASH MEMORY;

EID: 79959919347     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMW.2011.5873193     Document Type: Article

References (1)

1. E. Harari, "Dielectric breakdown in electrically stressed thin films of thermal SiO2," Appl. Phys. 49(4), pp.2478-2489, April 1978 (Pubitemid 8612291)