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Volumn , Issue , 2005, Pages 257-284

Domain testing

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EID: 79959912181     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/3-540-28901-1_13     Document Type: Chapter
Times cited : (2)

References (3)
  • 1
    • 84892199837 scopus 로고    scopus 로고
    • We define the term defect in analogy to [IEEE 1990]. The definition in [IEEE 1990] additionally distinguishes between error, fault, failure, and defect. We only use the term defect in this book as our focus is on testing issues that are specific to software product line engineering
    • We define the term defect in analogy to [IEEE 1990]. The definition in [IEEE 1990] additionally distinguishes between error, fault, failure, and defect. We only use the term defect in this book as our focus is on testing issues that are specific to software product line engineering.
  • 2
    • 84892318463 scopus 로고    scopus 로고
    • See [V.d. Linden and Muller 1995] or [Reuys et al. 2004a] for case studies of industrial test approaches and intermediate test levels
    • See [V.d. Linden and Muller 1995] or [Reuys et al. 2004a] for case studies of industrial test approaches and intermediate test levels.
  • 3
    • 84892354333 scopus 로고    scopus 로고
    • The sample applications may stem from product management or from development. The development team may choose a configuration that is easy to realise in order to speed up testing if product management does not define suitable samples
    • The sample applications may stem from product management or from development. The development team may choose a configuration that is easy to realise in order to speed up testing if product management does not define suitable samples.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.