Electronic packing frustration in complex intermetallic structures: The role of chemical pressure in Ca2Ag7

Journal of the American Chemical Society

Volumn 133, Issue 26, 2011, Pages 10070-10073

  Fredrickson, Daniel C ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PACKING; ATOMIC SIZE EFFECTS; CHEMICAL PHENOMENAS; CHEMICAL PRESSURES; ELECTRON COUNT; EXPLORATORY SYNTHESIS; INTER-ATOMIC DISTANCES; ORBITAL INTERACTION; STERICS;

ATOMS; CALCIUM; DEFECTS; SYNTHESIS (CHEMICAL);

INTERMETALLICS;

CALCIUM; COPPER; METAL DERIVATIVE; SILVER;

ARTICLE; CHEMICAL BOND; CHEMICAL REACTION; CHEMICAL STRUCTURE; ELECTRIC POTENTIAL; ELECTROCHEMICAL ANALYSIS; ELECTRONIC PACKING FRUSTRATION;

EID: 79959884924     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja203944a     Document Type: Article

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