Peculiarities of polyelectrolyte multilayer assembly on patterned surfaces

Langmuir

Volumn 27, Issue 13, 2011, Pages 8430-8436

  Kiryukhin, Maxim V ^a   Man, Shu Mei ^a   Sadovoy, Anton V ^a   Low, Hong Yee ^a   Sukhorukov, Gleb B ^a,b  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^b QUEEN MARY UNIVERSITY OF LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL STRESS; CRITICAL VALUE; EULER'S MODEL; LAYER-BY-LAYER ASSEMBLIES; MICROWELLS; PATTERNED SURFACE; POLY(DIALLYL-DIMETHYL-AMMONIUM CHLORIDE); POLY(SODIUM 4-STYRENESULFONATE); POLYELECTROLYTE CONFORMATION; POLYELECTROLYTE MULTILAYER; WELL DIAMETER;

ASPECT RATIO; CHLORINE COMPOUNDS; MICROSTRUCTURE; MULTILAYERS; POLYELECTROLYTES; SCANNING ELECTRON MICROSCOPY; SODIUM;

IONIC STRENGTH;

ELECTROLYTE; POLY N,N DIMETHYL N,N DIALLYLAMMONIUM CHLORIDE; POLY-N,N-DIMETHYL-N,N-DIALLYLAMMONIUM CHLORIDE; POLYETHYLENE DERIVATIVE; POLYSTYRENE DERIVATIVE; POLYSTYRENESULFONIC ACID; QUATERNARY AMMONIUM DERIVATIVE;

ARTICLE; CHEMISTRY; PARTICLE SIZE; SURFACE PROPERTY; SYNTHESIS;

ELECTROLYTES; PARTICLE SIZE; POLYETHYLENES; POLYSTYRENES; QUATERNARY AMMONIUM COMPOUNDS; SURFACE PROPERTIES;

EID: 79959785014     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la200939p     Document Type: Article

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