Nanoscale studies of defect-mediated polarization switching dynamics in ferroelectric thin film capacitors

Current Applied Physics

Volumn 11, Issue 5, 2011, Pages 1111-1125

  Yang, Sang Mo ^a   Yoon, Jong Gul ^b   Noh, Tae Won ^a  

^a Seoul National University   (South Korea)

^b Suwon University   (South Korea)

Author keywords

Defects; Domain switching; Ferroelectrics; Piezoresponse force microscopy; Polarization; Thin films

Indexed keywords

DOMAIN SWITCHING DYNAMICS; DOMAIN SWITCHINGS; DOMAIN-SWITCHING PROCESS; ELECTRICAL MEASUREMENT; FERROELECTRIC THIN-FILM CAPACITORS; NANO SCALE; PIEZORESPONSE FORCE MICROSCOPY; POLARIZATION SWITCHING;

DEFECTS; DOMAIN WALLS; DYNAMICS; FERROELECTRIC MATERIALS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; IMAGING TECHNIQUES; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; NUCLEATION; OPTICAL SWITCHES; POLARIZATION; THIN FILM CIRCUITS; THIN FILMS;

SWITCHING;

EID: 79959775003     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2011.05.017     Document Type: Review

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