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Analytical Methods

Volumn 3, Issue 4, 2011, Pages 814-821

The application of statistical methodology to the analysis of time-resolved X-ray diffraction data

(3) Burley, Jonathan C a O'Hare, Dermot b Williams, Gareth R b,c

a UNIVERSITY OF NOTTINGHAM (United Kingdom)

b UNIVERSITY OF OXFORD (United Kingdom)

c LONDON METROPOLITAN UNIVERSITY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CURVE FITTING METHODS; ENERGY-DISPERSIVE X-RAY DIFFRACTION; MODEL SYSTEM; POTENTIAL USERS; TIME-RESOLVED; TIME-RESOLVED X-RAY DIFFRACTION;

CURVE FITTING; DIFFRACTION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

PRINCIPAL COMPONENT ANALYSIS;

EID: 79959751810 PISSN: 17599660 EISSN: 17599679 Source Type: Journal
DOI: 10.1039/c0ay00772b Document Type: Article

Times cited : (11)

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