Automated characterization of ceramic multilayer capacitors

52nd ARFTG Conference Digest-Fall: Computer-Aided Design and Test for High-Speed Electronics, ARFTG 1998

Volumn , Issue , 1998, Pages 88-94

  Benabe, E ^a   Skowronski, K ^a   Weller, T ^a   Gordon, H ^a   Warder, P ^a,b  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

^b Radio Pioducts Americas Group   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; COMPUTER AIDED DESIGN; ELECTRIC NETWORK ANALYZERS; ELECTRIC RESISTANCE; PERSONAL COMPUTERS;

AUTOMATED TEST; CERAMIC MULTILAYER CAPACITORS; EQUIVALENT SERIES RESISTANCE; VECTOR NETWORK ANALYZERS;

MULTILAYERS;

EID: 79959698209     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1998.327320     Document Type: Conference Paper

References (0)