Using X-parameters to model RFID energy harvesting circuits

Proceedings of the 5th European Conference on Antennas and Propagation, EUCAP 2011

Volumn , Issue , 2011, Pages 2819-2822

  Boaventura, Alírio J S ^a   Carvalho, Nuno Borges ^a  

^a UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

Behavioral models; diode detectors; Harvesting circuits; Nonlinear black box modeling; Poly Harmonic Model; X parameters model

Indexed keywords

BEHAVIORAL MODEL; BLACK-BOX MODELING; DIODE DETECTORS; POLY-HARMONIC MODEL; X-PARAMETERS;

ANTENNAS; COMPUTER SIMULATION; CRYPTOGRAPHY; DC POWER TRANSMISSION; HARVESTERS; MATHEMATICAL MODELS; POWER AMPLIFIERS;

ENERGY HARVESTING;

EID: 79959669746     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. Finkenzeller, Klaus, "RFID Handbook", 2nd Edition ed. Wiley
2. Agilent Application Note "Schottky Diode Voltage Doubler"
3. Hugo Gomes, Alejandro R. Testera, Nuno Borges Carvalho, Mónica F. Barciela and Kate A. Remley, "The Impact of Long-term Memory Effects on Diode Power Probes", International Microwave Symposium, May, 2010, Anaheim, CA, USA.
4. Hugo Gomes, Alejandro R. Testera, Nuno Borges Carvalho, Mónica F. Barciela, Kate A. Remley, "Diode Power Probe Measurements of Wireless Signals"
5. Agilent Application Note "Memory Effects in Microwave Components - X-Parameters to Characterize and Model Long-Term Memory Effects of Wideband Modulated Signals", May 2010
6. Jan Verspecht, "Describing Functions Can Better Model Hard Nonlinearities In The Frequency Domain Than The Volterra Theory," Ph. D. Thesis Annex, Vrije Universiteit Brussel, Brussels, Belgium, 1995.
7. Jan Verspecht, "Black Box Modelling of Power Transistors in the Frequency Domain"
8. Jan Verspecht and David E. Root, "Polyharmonic Distortion Modeling", IEEE microwave magazine, June 2006
9. X-Parameter Measurements Application Note http://na.tm.agilent.com/pna/ nvna/NVNAWebHelp/XParameter-Measurements.htm#config