Mahalanobis distance approach for insulated gate bipolar transistors (IGBT) diagnostics

Advanced Concurrent Engineering

Volumn , Issue , 2010, Pages 583-591

  Patil, Nishad ^a   Das, Diganta ^a   Pecht, Michael ^a,b  

^a UNIVERSITY OF MARYLAND   (United States)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Diagnostics; IGBT; Mahalanobis distance; PHM

Indexed keywords

ANOMALY DETECTION; BOX-COX TRANSFORMS; COLLECTOR EMITTERS; COLLECTOR-EMITTER VOLTAGE; CRITICAL APPLICATIONS; DETECTION TIME; DIAGNOSTIC APPROACH; HIGH POWER SWITCH; HYBRID CARS; INPUT PARAMETER; MAHALANOBIS DISTANCES; NON-PUNCH-THROUGH; PHM; RESISTIVE LOADS; VARIABLE SPEED;

CONCURRENT ENGINEERING; ELECTRIC DRIVES; ELECTRIC POWER SYSTEMS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); PLASMA DIAGNOSTICS;

DIGITAL STORAGE;

EID: 79959637637     PISSN: 18655440     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1007/978-0-85729-024-3-60     Document Type: Conference Paper

References (8)

1. Box G, Cox D. An analysis of transformations. J Roy Stat Soc. Series B (Methodological) 1964; 26:211-252.
2. De Maesschalck R, Jouan-Rimbaud D, Massart D. The Mahalanobis distance. Chem Intel Lab Sys 2000; 50:1-18.
3. Kumar S, Chow T, Pecht M. Approach to fault identification for electronic products using Mahalanobis distance. In Press, IEEE Trans Instr Meas.
4. Lu B, Sharma S. A literature review of IGBT fault diagnostic and protection methods for power inverters. IEEE Trans Ind App 2009;45:1770-1777.
5. Nie L, Azarian M, Keimasi M, Pecht M. Prognostics of ceramic capacitor temperaturehumidity-bias reliability using Mahalanobis distance analysis. Circuit World 2007;33:21-28.
6. Patil N, Celaya J, Das D, Goebel K, Pecht M. Precursor parameter identification for IGBT prognostics. IEEE Trans Rel 2009;58:271-276.
7. Khanna V. The insulated gate bipolar transistor: IGBT theory and design. John Wiley and Sons, Hoboken, NJ, 2003.
8. Lorenz L. Power semiconductor devices and smart power IC's - the enabling technology for future high efficient power conversion systems. In: Proc IPEMC, 193-201, 2009.