Microstructure and piezoelectric properties of Bi0.5(Na 0.82K0.18)0.5TiO3-NaSbO3 ceramics

Journal of Physics and Chemistry of Solids

Volumn 72, Issue 8, 2011, Pages 909-913

  Zhou, Qin ^a   Zhou, Changrong ^a   Li, Weizhou ^b   Cheng, Jun ^a   Wang, Hua ^a   Yuan, Changlai ^a  

^a GUILIN UNIVERSITY OF ELECTRONIC TECHNOLOGY   (China)

^b GUANGXI UNIVERSITY   (China)

Author keywords

A. Electronic materials; C. X ray diffraction; D. Dielectric properties; D. Piezoelectricity

Indexed keywords

ANTIFERROELECTRIC PHASE TRANSITION; ANTIFERROELECTRIC PHASIS; CANDIDATE MATERIALS; D. DIELECTRIC PROPERTIES; D. PIEZOELECTRICITY; DOPING CONTENT; ELECTRO MECHANICAL COUPLING FACTORS; ELECTRONIC MATERIALS; LEAD-FREE PIEZOELECTRIC CERAMIC; LEAD-FREE PIEZOELECTRICS; MAXIMUM VALUES; PARAELECTRIC PHASIS; PIEZOELECTRIC CONSTANT; PIEZOELECTRIC PROPERTY; RHOMBOHEDRAL PHASE; TEMPERATURE RANGE; TIO;

ANTIFERROELECTRICITY; CERAMIC MATERIALS; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTROMECHANICAL COUPLING; MICROSTRUCTURE; PHASE TRANSITIONS; PIEZOELECTRIC CERAMICS; SODIUM; X RAY DIFFRACTION;

PIEZOELECTRICITY;

EID: 79959547288     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2011.01.010     Document Type: Article

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