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Volumn 109, Issue 9, 2011, Pages

Influences of film microstructure and defects on magnetization reversal in bit patterned Co/Pt multilayer thin film media

Author keywords

[No Author keywords available]

Indexed keywords

CO/PT MULTILAYER; CO/PT MULTILAYER THIN FILM; CRITICAL SIZE; CRYSTALLINE FILMS; EXCHANGE COUPLING STRENGTH; FILM MICROSTRUCTURES; MICROMAGNETIC MODELING; MULTI-LAYERED FILMS; NUCLEATION FIELD; PATTERNED ELEMENTS; PLANAR DEFECT; POLYCRYSTALLINE; POLYCRYSTALLINE FILM; SINGLE DOMAINS; SMALL ISLAND; SPUTTERING TECHNIQUES; TWIN BOUNDARIES;

EID: 79959528295     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3558986     Document Type: Article
Times cited : (7)

References (17)
  • 1
    • 33745531234 scopus 로고    scopus 로고
    • Intrinsic distribution of magnetic anisotropy in thin films probed by patterned nanostructures
    • DOI 10.1103/PhysRevLett.96.257204
    • T. Thomson, G. Hu, and B. D. Terris, Phys. Rev. Lett. 96, 257204 (2006). 10.1103/PhysRevLett.96.257204 (Pubitemid 43980779)
    • (2006) Physical Review Letters , vol.96 , Issue.25 , pp. 257204
    • Thomson, T.1    Hu, G.2    Terris, B.D.3
  • 14
    • 79959530798 scopus 로고
    • Ph.D. thesis (University of California)
    • J.-G. Zhu, Ph.D. thesis (University of California, 1989).
    • (1989)
    • Zhu, J.-G.1
  • 15
    • 11644306478 scopus 로고
    • 10.1103/RevModPhys.21.541
    • C. Kittel, Rev. Mod. Phys. 21, 541 (1949). 10.1103/RevModPhys.21.541
    • (1949) Rev. Mod. Phys. , vol.21 , pp. 541
    • Kittel, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.