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Volumn 109, Issue 11, 2011, Pages

Effect of PbZr0.52Ti0.48O3 thin layer on structure, electronic and magnetic properties of La0.65Sr 0.35 MnO3 and La0.65Ca0.30MnO 3 thin-films

(7) Hezareh, T a Razavi, F S a Kremer, R K b Habermeier, H U b Lebedev, O I c Kirilenko, D d Tendeloo, G Van d

a BROCK UNIVERSITY (Canada)

b MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG (Germany)

c UNIVERSITÉ DE CAEN (France)

d UNIVERSITY OF ANTWERP (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CMR MATERIALS; ELECTRIC TRANSPORT; ELECTRICAL RESISTIVITY; ELECTRONIC AND MAGNETIC PROPERTIES; EPITAXIAL THIN FILMS; LATTICE DISTORTIONS; PZT; PZT LAYER; SRTIO; TEMPERATURE DEPENDENCE; THIN LAYERS;

ALKALINE EARTH METALS; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; FILM THICKNESS; LIGHT METALS; MAGNETIC PROPERTIES; MANGANESE OXIDE; THIN FILMS;

LANTHANUM;

EID: 79959387329 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3592660 Document Type: Article

Times cited : (5)

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