SCOPUS 정보 검색 플랫폼

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2011, Pages

Soft error testing at advanced technology nodes

(9) Bhuva, B a Narasimham, B b Oates, A c Patterson, K b Tam, N d Vilchis, M e Wen, S J f Wong, R f Xu, Y g

a VANDERBILT UNIVERSITY (United States)

b BROADCOM CORPORATION (United States)

c TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY (Taiwan)

d MARVELL SEMICONDUCTOR INC (United States)

e AGERE SYSTEMS (United States)

f CISCO SYSTEMS (United States)

g ALTERA CORPORATION (United States)

Author keywords

alpha particles; IC design; neutrons; Soft errors; testing

Indexed keywords

ADVANCED TECHNOLOGY; COMPLETE SOLUTIONS; FAILURE MECHANISM; FLIP-FLOP DESIGNS; IC DESIGN; KNOWLEDGE DATABASE; SOFT ERROR; TECHNOLOGY NODES; TEST RESULTS; TEST VEHICLE;

ERROR CORRECTION; FLIP FLOP CIRCUITS; MICROPROCESSOR CHIPS; NANOTECHNOLOGY; PERSONNEL TRAINING;

DESIGN;

EID: 79959315374 PISSN: 15417026 EISSN: None Source Type: Conference Proceeding
DOI: 10.1109/IRPS.2011.5784519 Document Type: Conference Paper

Times cited : (2)

References (4)

1
- 33144490672
- Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)
- Dec.
- P. Marshall, M. Carts, S. Currie, R. Reed, B. Randall, K. Fritz, K. Kennedy, M. Berg, R. Krithivasan, C. Siedleck, R. Ladbury, C. Marshall, J. Cressler, Niu Guofu, K. LaBel, and B. Gilbert. "Autonomous bit error rate testing at multi-gbit/s rates implemented in a 5AM SiGe circuit for radiation effects self test (CREST)," IEEE Trans. Nucl. Sci., vol. 52, no. 6, pp. 2446-2454, Dec. 2005.
- (2005) IEEE Trans. Nucl. Sci. , vol.52 , Issue.6 , pp. 2446-2454
- Marshall, P.¹ Carts, M.² Currie, S.³ Reed, R.⁴ Randall, B.⁵ Fritz, K.⁶ Kennedy, K.⁷ Berg, M.⁸ Krithivasan, R.⁹ Siedleck, C.¹⁰ Ladbury, R.¹¹ Marshall, C.¹² Cressler, J.¹³ Guofu, N.¹⁴ LaBel, K.¹⁵ Gilbert, B.¹⁶

2
- 33845533769
- On-chip characterization of single event transient pulse widths
- B. Narasimham, V. Ramachandran, B. L. Bhuva, R. D. Schrimpf, A. F. Witulski, W. T. Holman, L. W. Massengill, J. D. Black, W. H. Robinson, D. McMorrow, "On-chip characterization of single event transient pulse widths", IEEE Trans. on Dev. and Mat. Rel., vol. 6, p. 542-549, 2006.
- (2006) IEEE Trans. on Dev. and Mat. Rel. , vol.6 , pp. 542-549
- Narasimham, B.¹ Ramachandran, V.² Bhuva, B.L.³ Schrimpf, R.D.⁴ Witulski, A.F.⁵ Holman, W.T.⁶ Massengill, L.W.⁷ Black, J.D.⁸ Robinson, W.H.⁹ McMorrow, D.¹⁰

3
- 72349087293
- Laser verification of charge sharing in a 90 nm bulk CMOS process
- December
- O. A. Amusan, M. C. Casey, B. L. Bhuva, D. McMorrow, M. J. Gadlage, J. S. Melinger, L. W. Massengill, "Laser verification of charge sharing in a 90 nm bulk CMOS process," IEEE Trans. On Nucl. Sci., Vol. 56, No. 6, pp. 3065-3070, December 2009.
- (2009) IEEE Trans. on Nucl. Sci. , vol.56 , Issue.6 , pp. 3065-3070
- Amusan, O.A.¹ Casey, M.C.² Bhuva, B.L.³ McMorrow, D.⁴ Gadlage, M.J.⁵ Melinger, J.S.⁶ Massengill, L.W.⁷

4
- 79959294126
- Neutron and alpha particles induced soft error rates for flip-flops at a 40 nm technology node
- Accepted for publications at
- S. Jagannathan, T. D. Loveless, Z. Diggins, B. L. Bhuva, S.-J. Wen, R. Wong, L. W. Massengill, "Neutron and alpha particles induced soft error rates for flip-flops at a 40 nm technology node," Accepted for publications at 2011 IRPS Conference.
- 2011 IRPS Conference
- Jagannathan, S.¹ Loveless, T.D.² Diggins, Z.³ Bhuva, B.L.⁴ Wen, S.-J.⁵ Wong, R.⁶ Massengill, L.W.⁷

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.