SCOPUS 정보 검색 플랫폼

Applied Physics A: Materials Science and Processing

Volumn 104, Issue 1, 2011, Pages 23-28

Effect of surface roughness on thermal conductivity of VLS-grown rough Si1-x Ge x nanowires

(6) Kim, Hyoungjoon a Park, Yong Hee a Kim, Ilsoo a Kim, Jungwon a Choi, Heon Jin a Kim, Woochul a

a Yonsei University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY SCATTERING; BOUNDARY SCATTERING; LONG WAVELENGTH; NANO-SCALE PORES; PHONON-BOUNDARY SCATTERING; SHORT-WAVELENGTH; SI NANOWIRE; VAPOR-LIQUID-SOLID;

GERMANIUM; NANOWIRES; PHONONS; SCATTERING; SILICON; SURFACE PROPERTIES; SURFACE ROUGHNESS;

THERMAL CONDUCTIVITY OF SOLIDS;

EID: 79959231789 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-011-6475-0 Document Type: Article

Times cited : (40)

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