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Applied Physics A: Materials Science and Processing

Volumn 104, Issue 1, 2011, Pages 171-175

Excimer laser deposited CuO and Cu2O films with third-order optical nonlinearities by femtosecond z-scan measurement

(5) Yang, Guang a Chen, Aiping a Fu, Ming a Long, Hua a Lu, Peixiang a

a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (China)

Author keywords

[No Author keywords available]

Indexed keywords

FEMTO-SECOND LASER; FEMTOSECOND LASER EXCITATION; FEMTOSECONDS; GAN FILM; IMAGINARY PARTS; LARGE OPTICAL NONLINEARITIES; LINEAR OPTICAL; NONLINEAR OPTICAL EFFECTS; OFF-RESONANCE; OPTICAL NONLINEARITY; OXYGEN PRESSURE; PULSED-LASER DEPOSITION TECHNIQUE; QUARTZ SUBSTRATE; SEMICONDUCTOR FILMS; STRUCTURE PROPERTY; THIRD-ORDER; THIRD-ORDER NONLINEAR SUSCEPTIBILITY; THIRD-ORDER OPTICAL NONLINEARITIES; UV-VIS SPECTROSCOPY; Z-SCAN MEASUREMENT; ZNO;

ABSORPTION SPECTROSCOPY; COPPER; DEPOSITION; ELECTRONIC STRUCTURE; EXCIMER LASERS; GALLIUM NITRIDE; LASER EXCITATION; NONLINEAR OPTICS; PULSED LASER DEPOSITION; PULSED LASERS; QUARTZ; SEMICONDUCTOR LASERS; ULTRASHORT PULSES; ULTRAVIOLET SPECTROSCOPY; X RAY DIFFRACTION; ZINC OXIDE;

OPTICAL FILMS;

EID: 79959195006 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-010-6092-3 Document Type: Article

Times cited : (27)

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