-
1
-
-
0033579113
-
-
10.1021/ja9906150
-
R. Cohen, L. Kronik, A. Shanzer, D. Cahen, A. Liu, Y. Rosenwaks, J. K. Lorenz, and A. B. Ellis, J. Am. Chem. Soc. 121, 10545 (1999). 10.1021/ja9906150
-
(1999)
J. Am. Chem. Soc.
, vol.121
, pp. 10545
-
-
Cohen, R.1
Kronik, L.2
Shanzer, A.3
Cahen, D.4
Liu, A.5
Rosenwaks, Y.6
Lorenz, J.K.7
Ellis, A.B.8
-
3
-
-
20144370712
-
Enhanced conductance of chlorine-terminated Si(111) surfaces: Formation of a two-dimensional hole gas via chemical modification
-
DOI 10.1103/PhysRevB.71.125308, 125308
-
G. P. Lopinski, B. J. Eves, O. Hul'ko, C. Mark, S. N. Patitsas, R. Boukherroub, and T. R. Ward, Phys. Rev. B 71, 125308 (2005). 10.1103/PhysRevB.71.125308 (Pubitemid 40777636)
-
(2005)
Physical Review B - Condensed Matter and Materials Physics
, vol.71
, Issue.12
, pp. 1-4
-
-
Lopinski, G.P.1
Eves, B.J.2
Hul'ko, O.3
Mark, C.4
Patitsas, S.N.5
Boukherroub, R.6
Ward, T.R.7
-
4
-
-
49149103472
-
-
10.1063/1.2958343
-
O. Shaya, M. Shaked, A. Doron, A. Cohen, I. Levy, and Y. Rosenwaks, Appl. Phys. Lett. 93, 043509 (2008). 10.1063/1.2958343
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 043509
-
-
Shaya, O.1
Shaked, M.2
Doron, A.3
Cohen, A.4
Levy, I.5
Rosenwaks, Y.6
-
5
-
-
54549121483
-
-
10.1021/la800882e
-
R. K. Hiremath, M. K. Rabinal, B. G. Mulimani, and I. M. Khazi, Langmuir 24, 11300 (2008). 10.1021/la800882e
-
(2008)
Langmuir
, vol.24
, pp. 11300
-
-
Hiremath, R.K.1
Rabinal, M.K.2
Mulimani, B.G.3
Khazi, I.M.4
-
6
-
-
67650733825
-
-
10.1063/1.3167414
-
G. Shalev, E. Halpern, A. Doron, A. Cohen, Y. Rosenwaks, and I. Levy, J. Chem. Phys. 131, 024702 (2009). 10.1063/1.3167414
-
(2009)
J. Chem. Phys.
, vol.131
, pp. 024702
-
-
Shalev, G.1
Halpern, E.2
Doron, A.3
Cohen, A.4
Rosenwaks, Y.5
Levy, I.6
-
7
-
-
33750978435
-
Controlled modulation of conductance in silicon devices by molecular monolayers
-
DOI 10.1021/ja063571l
-
T. He, J. He, M. Lu, B. Chen, H. Pang, W. F. Reus, W. M. Nolte, D. P. Nackashi, P. D. Franzon, and J. M. Tour, J. Am. Chem. Soc. 128, 14537 (2006). 10.1021/ja063571l (Pubitemid 44749853)
-
(2006)
Journal of the American Chemical Society
, vol.128
, Issue.45
, pp. 14537-14541
-
-
He, T.1
He, J.2
Lu, M.3
Chen, B.4
Pang, H.5
Reus, W.F.6
Nolte, W.M.7
Nackashi, D.P.8
Franzon, P.D.9
Tour, J.M.10
-
8
-
-
36849046157
-
Influence of physisorbed water on the conductivity of hydrogen terminated silicon-on-insulator surfaces
-
DOI 10.1063/1.2822417
-
G. Dubey, G. P. Lopinski, and F. Rosei, Appl. Phys. Lett. 91, 232111 (2007). 10.1063/1.2822417 (Pubitemid 350234456)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.23
, pp. 232111
-
-
Dubey, G.1
Lopinski, G.P.2
Rosei, F.3
-
9
-
-
68649101506
-
-
10.1021/nn9000947
-
S. A. Scott, W. Peng, A. M. Kiefer, H. Jiang, I. Knezevic, D. E. Savage, M. A. Eriksson, and M. G. Lagally, ACS Nano 3, 1683 (2009). 10.1021/nn9000947
-
(2009)
ACS Nano
, vol.3
, pp. 1683
-
-
Scott, S.A.1
Peng, W.2
Kiefer, A.M.3
Jiang, H.4
Knezevic, I.5
Savage, D.E.6
Eriksson, M.A.7
Lagally, M.G.8
-
12
-
-
35148881522
-
A modified pseudoMOS technique to characterize interface quality of SOI wafers
-
DOI 10.1109/TED.2007.904013
-
L. Hollt, M. Born, M. Schlosser, I. Eisele, J. Grabmeier, and A. Huber, IEEE Trans. Electron. Devices 54, 2685 (2007). 10.1109/TED.2007.904013 (Pubitemid 47534488)
-
(2007)
IEEE Transactions on Electron Devices
, vol.54
, Issue.10
, pp. 2685-2689
-
-
Hollt, L.1
Born, M.2
Schlosser, M.3
Eisele, I.4
Grabmeier, J.5
Huber, A.6
-
13
-
-
0037598585
-
-
10.1016/S0038-1101(03)00065-0
-
H. J. Hovel, Solid-State Electron. 47, 1311 (2003). 10.1016/S0038- 1101(03)00065-0
-
(2003)
Solid-State Electron.
, vol.47
, pp. 1311
-
-
Hovel, H.J.1
-
14
-
-
39349091830
-
Transport measurements in silicon-on-insulator films: Comparison of Hall effect, mobility spectrum, and pseudo-metal-oxide-semiconductor-field-effect- transistor techniques
-
DOI 10.1063/1.2837841
-
T. V. C. Rao, J. Antoszewski, L. Faraone, S. Cristoloveanu, T. Nguyen, P. Gentil, N. Bresson, and F. Allibert, J. Appl. Phys. 103, 034503 (2008). 10.1063/1.2837841 (Pubitemid 351263972)
-
(2008)
Journal of Applied Physics
, vol.103
, Issue.3
, pp. 034503
-
-
Chandrasekhar Rao, T.V.1
Antoszewski, J.2
Faraone, L.3
Cristoloveanu, S.4
Nguyen, T.5
Gentil, P.6
Bresson, N.7
Allibert, F.8
-
15
-
-
0036735394
-
-
10.1002/1521-3951(200209)233:11.0.CO;2-K
-
G. M. Laws, T. J. Thornton, J. Yang, L. De la Garza, M. Kozicki, and D. Gust, Phys. Status Solidi B 233, 83 (2002). 10.1002/1521-3951(200209)233:11.0. CO;2-K
-
(2002)
Phys. Status Solidi B
, vol.233
, pp. 83
-
-
Laws, G.M.1
Thornton, T.J.2
Yang, J.3
De La Garza, L.4
Kozicki, M.5
Gust, D.6
-
16
-
-
67651232271
-
-
10.1021/ja9002537
-
T. He, A. Corley, M. Lu, N. H. Di Spigna, J. He, D. P. Nackashi, P. D. Franzon, and J. M. Tour, J. Am. Chem. Soc. 131, 10023 (2009). 10.1021/ja9002537
-
(2009)
J. Am. Chem. Soc.
, vol.131
, pp. 10023
-
-
He, T.1
Corley, A.2
Lu, M.3
Di Spigna, N.H.4
He, J.5
Nackashi, D.P.6
Franzon, P.D.7
Tour, J.M.8
-
17
-
-
57349135670
-
-
10.1002/adma.200703084
-
T. He, M. Lu, J. Yao, J. He, B. Chen, N. H. Di Spigna, D. P. Nackashi, P. D. Franzon, and J. M. Tour, Adv. Mater. 20, 4541 (2008). 10.1002/adma.200703084
-
(2008)
Adv. Mater.
, vol.20
, pp. 4541
-
-
He, T.1
Lu, M.2
Yao, J.3
He, J.4
Chen, B.5
Di Spigna, N.H.6
Nackashi, D.P.7
Franzon, P.D.8
Tour, J.M.9
-
18
-
-
79958837496
-
-
On the 150 nm nominally p-doped SOI substrates, Hall effect measurements indicated n-type conduction in the tosilicon layer, a common occurrence for p-type SIMOX wafers that is known to arise from the formation of oxygen related donors at the BOX interface.
-
On the 150 nm nominally p-doped SOI substrates, Hall effect measurements indicated n-type conduction in the top silicon layer, a common occurrence for p-type SIMOX wafers that is known to arise from the formation of oxygen related donors at the BOX interface.
-
-
-
-
19
-
-
79958854392
-
-
When large gate leakage currents were encountered, the samples were discarded. Sidewall leakage from the Si film edge to the substrate was suspected.
-
When large gate leakage currents were encountered, the samples were discarded. Sidewall leakage from the Si film edge to the substrate was suspected.
-
-
-
-
22
-
-
0040184885
-
-
10.1063/1.347181
-
M. Morita, T. Ohmi, E. Hasegawa, M. Kawakami, and M. Ohwada, J. Appl. Phys. 68, 1272 (1990). 10.1063/1.347181
-
(1990)
J. Appl. Phys.
, vol.68
, pp. 1272
-
-
Morita, M.1
Ohmi, T.2
Hasegawa, E.3
Kawakami, M.4
Ohwada, M.5
-
23
-
-
79958785743
-
-
High resolution energy loss spectroscopy spectra of H-terminated samples obtained in the course of this study show no evidence of oxidation after 7 h of exposure to H2O under conditions similar to those for the electrical measurements.
-
High resolution energy loss spectroscopy spectra of H-terminated samples obtained in the course of this study show no evidence of oxidation after 7 h of exposure to H2O under conditions similar to those for the electrical measurements.
-
-
-
-
24
-
-
33750030494
-
Large area, dense silicon nanowire array chemical sensors
-
DOI 10.1063/1.2358214
-
A. A. Talin, L. L. Hunter, F. Leonard, and B. Rokad, Appl. Phys. Lett. 89, 153102 (2006). 10.1063/1.2358214 (Pubitemid 44570592)
-
(2006)
Applied Physics Letters
, vol.89
, Issue.15
, pp. 153102
-
-
Talin, A.A.1
Hunter, L.L.2
Lonard, F.3
Rokad, B.4
-
28
-
-
0029274673
-
-
10.1021/ja00116a019
-
M. R. Linford, P. Fenter, P. M. Eisenberger, and C. E. D. Chidsey, J. Am. Chem. Soc. 117, 3145 (1995). 10.1021/ja00116a019
-
(1995)
J. Am. Chem. Soc.
, vol.117
, pp. 3145
-
-
Linford, M.R.1
Fenter, P.2
Eisenberger, P.M.3
Chidsey, C.E.D.4
-
29
-
-
0032675524
-
-
10.1021/la9901478
-
R. Boukherroub, S. Morin, F. Bensebaa, and D. D. M. Wayner, Langmuir 15, 3831 (1999). 10.1021/la9901478
-
(1999)
Langmuir
, vol.15
, pp. 3831
-
-
Boukherroub, R.1
Morin, S.2
Bensebaa, F.3
Wayner, D.D.M.4
-
31
-
-
0026868367
-
Morphology of hydrogen-terminated Si(111) and Si(100) surfaces upon etching in HF and buffered-HF solutions
-
DOI 10.1016/0039-6028(92)91363-G
-
P. Dumas, Y. J. Chabal, and P. Jakob, Surf. Sci. 269, 867 (1992). 10.1016/0039-6028(92)91363-G (Pubitemid 23561513)
-
(1992)
Surface Science
, vol.269 PART 70
, Issue.1-3 PART B
, pp. 867-878
-
-
Dumas, P.1
Chabal, Y.J.2
Jakob, P.3
-
32
-
-
0006163257
-
-
10.1021/ja00246a011
-
M. D. Porter, T. B. Bright, D. L. Allara, and C. E. D. Chidsey, J. Am. Chem. Soc. 109, 3559 (1987). 10.1021/ja00246a011
-
(1987)
J. Am. Chem. Soc.
, vol.109
, pp. 3559
-
-
Porter, M.D.1
Bright, T.B.2
Allara, D.L.3
Chidsey, C.E.D.4
-
34
-
-
27144498545
-
-
10.1002/cphc.v6:10
-
E. J. Faber, L. C. P. M. de Smet, W. Olthuis, H. Zuilhof, E. J. R. Sudhlter, P. Bergveld, and A. van den Berg, ChemPhysChem 6, 2153 (2005). 10.1002/cphc.v6:10
-
(2005)
ChemPhysChem
, vol.6
, pp. 2153
-
-
Faber, E.J.1
Smet, L.C.P.M.D.2
Olthuis, W.3
Zuilhof, H.4
Sudhlter, E.J.R.5
Bergveld, P.6
Van Den Berg, A.7
-
35
-
-
79958800829
-
-
These might be related to impurities in the decene solution or oxygen present in the background pressure of the chamber, in which case the process could be optimized. They might also originate from the generation of a small density of uncapped dangling bonds (mid-gastates) during the chain reaction.
-
These might be related to impurities in the decene solution or oxygen present in the background pressure of the chamber, in which case the process could be optimized. They might also originate from the generation of a small density of uncapped dangling bonds (mid-gap states) during the chain reaction.
-
-
-
|