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Volumn 196, Issue 17, 2011, Pages 7097-7103

Segmented cell testing for cathode parameter investigation

Author keywords

Cathode degradation; Long term testing; Parallel testing; Segmented testing; SOFC

Indexed keywords

ANODE SUPPORTED CELL; CATHODE COMPOSITION; CATHODE THICKNESS; CELL PERFORMANCE; CHROMIUM POISONING; DATA OUTPUT; DEGRADATION BEHAVIOR; DIRECT IMPACT; ELECTROCHEMICAL CHARACTERIZATIONS; ELECTROLYTE-SUPPORTED CELLS; GALVANOSTATICS; HIGH SENSITIVITY; INTERCONNECT MATERIALS; LONG-TERM TESTING; MULTI-CHANNEL; OPERATING CONDITION; PARALLEL TESTING; REPRODUCIBILITIES; RUN TEST; SEGMENTED CELL; SEGMENTED TESTING; TESTING CONDITIONS;

EID: 79958826678     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2010.08.034     Document Type: Conference Paper
Times cited : (12)

References (31)
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    • Wuillemin, Z.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.