Thickness measurement of colloidal opal crystal growth by Bragg reflection

Journal of Colloid and Interface Science

Volumn 360, Issue 2, 2011, Pages 331-334

  Lin, Ming Zheng ^a   Li, Guan Hui ^a   Chern, Ming Yau ^a   Lan, Chung Wen ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

Bragg reflection and transfer matrix; Dip coating; Opal crystal

Indexed keywords

BRAGG REFLECTION; DIELECTRIC LAYER; DIP COATING; DIPCOATING METHODS; INCIDENT LIGHT; NUMBER OF LAYERS; OPAL CRYSTAL; OPTICAL REFLECTANCE; PEAK POSITION; REFLECTANCE SIMULATION; REFLECTION SPECTRA; SELF-ASSEMBLING; SIMPLE METHOD; SINGLE LAYER; THICKNESS ESTIMATION; TRANSFER MATRIXES;

COATINGS; CRYSTAL GROWTH; CRYSTALS; LASER OPTICS; REFLECTION; THICKNESS MEASUREMENT;

TRANSFER MATRIX METHOD;

SELF ASSEMBLED MONOLAYER;

ARTICLE; BRAGG REFLECTION; COLLOID; COLLOIDAL OPAL CRYSTAL; CRYSTAL STRUCTURE; DIELECTRIC CONSTANT; MATERIAL COATING; MOLECULAR DYNAMICS; OPTICAL RESOLUTION; POLARIZATION; PRIORITY JOURNAL; REFLECTOMETRY; THICKNESS;

EID: 79958822001     PISSN: 00219797     EISSN: 10957103     Source Type: Journal    
DOI: 10.1016/j.jcis.2011.04.090     Document Type: Article

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