Data processing for the SNS EQ-SANS diffractometer

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 647, Issue 1, 2011, Pages 107-111

  Zhao, Jinkui ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Data processing; Time dependent studies; TOF SANS

Indexed keywords

DATA FILES; DATA SETS; MESSAGE PASSING INTERFACE; SCATTERING DATA; SCATTERING INTENSITY; SMALL ANGLE SCATTERING; SPALLATION NEUTRON SOURCES; TEMPERATURE JUMP; TIME OF FIGHTS; TIME-DEPENDENT; TOF-SANS;

DIFFRACTION; DIFFRACTOMETERS; MESSAGE PASSING; NEUTRON SOURCES; NEUTRONS; PARALLEL ARCHITECTURES; SCATTERING; SPALLING; SUPERCONDUCTING MATERIALS;

DATA PROCESSING;

EID: 79958813638     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2011.05.048     Document Type: Article

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