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Journal of Sol-Gel Science and Technology

Volumn 58, Issue 2, 2011, Pages 530-534

Structural characterization of amorphous and nanostructured bismuth silicate xerogels

(4) Ponta, O a Mocuta, H a Vasilescu, M a Simon, S a

a BABE BOLYAI UNIVERSITY (Romania)

Author keywords

Amorphous xerogels; EPR; Local structure; Nanocrystallites; NMR; XRD

Indexed keywords

AMORPHOUS MATRICES; AMORPHOUS XEROGELS; BISMUTH SILICATE; EPR SPECTRA; LOCAL ORDER; LOCAL STRUCTURE; MAS NMR; NANO-STRUCTURED; PARAMAGNETIC IONS; RICH PHASE; SILICON RICH; STRUCTURAL CHANGE; STRUCTURAL CHARACTERIZATION; THERMAL HISTORY; XRD;

BISMUTH; ELECTRON SPIN RESONANCE SPECTROSCOPY; GADOLINIUM; HEAT TREATMENT; NANOCRYSTALLITES; NUCLEAR MAGNETIC RESONANCE; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; PARAMAGNETIC MATERIALS; PARAMAGNETIC RESONANCE; PARAMAGNETISM; RESONANCE; SILICA GEL; SILICATES; SILICON OXIDES; SOL-GEL PROCESS; X RAY DIFFRACTION; XEROGELS;

AMORPHOUS SILICON;

EID: 79958791353 PISSN: 09280707 EISSN: None Source Type: Journal
DOI: 10.1007/s10971-011-2423-x Document Type: Article

Times cited : (11)

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