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Volumn 57, Issue 201, 2011, Pages 17-29

Instruments and methods: Measurement of vertical profiles of snow specific surface area with a 1 cm resolution Using infrared reflectance: Instrument description and validation

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ERROR ANALYSIS; GLACIOLOGY; INFRARED IMAGERY; MEASUREMENT METHOD; MICROSTRUCTURE; RADIATIVE TRANSFER; SNOW COVER; SURFACE AREA; VERTICAL PROFILE; ZENITH ANGLE;

EID: 79958780968     PISSN: 00221430     EISSN: None     Source Type: Journal    
DOI: 10.3189/002214311795306664     Document Type: Article
Times cited : (72)

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