Direct observation of nanometer-scale amorphous layers and oxide crystallites at grain boundaries in polycrystalline Sr1-xK x Fe2 As2 superconductors

Applied Physics Letters

Volumn 98, Issue 22, 2011, Pages

  Wang, Lei ^a   Ma, Yanwei ^a   Wang, Qingxiao ^b   Li, Kun ^b   Zhang, Xixiang ^b   Qi, Yanpeng ^a   Gao, Zhaoshun ^a   Zhang, Xianping ^a   Wang, Dongliang ^a   Yao, Chao ^a   Wang, Chunlei ^a  

^a INSTITUTE OF ELECTRICAL ENGINEERING   (China)

^b KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Saudi Arabia)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS LAYER; ATOMIC RESOLUTION; BICRYSTAL FILMS; COHERENCE LENGTHS; NANO-METER-SCALE; OXYGEN ENRICHMENT; POLYCRYSTALLINE; POLYCRYSTALLINE SAMPLES; TRANSPORT CRITICAL CURRENT DENSITY;

CRYSTALLITES; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; SUPERCONDUCTING MATERIALS; SUPERCONDUCTIVITY;

AMORPHOUS MATERIALS;

EID: 79958779732     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3592580     Document Type: Article

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