Deformation characteristics of ultra-thin liquid film considering temperature and film thickness dependence of surface tension : Three-dimensional analyses by the unsteady and linearized long wave equation

Microsystem Technologies

Volumn 17, Issue 5-7, 2011, Pages 983-990

  Matsuoka, Hiroshige ^a   Oka, Koji ^a   Yamashita, Yusuke ^a   Saeki, Fumihiro ^a   Fukui, Shigehisa ^a  

^a TOTTORI UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION CHARACTERISTICS; LOCAL HEATING; LONG WAVE EQUATIONS; MULTI-LAYER SYSTEM; PRESSURE EQUATIONS; TEMPERATURE DEPENDENCE; THERMOCAPILLARY; THICKNESS DEPENDENCE; THREE-DIMENSIONAL ANALYSIS; TIME EVOLUTIONS; ULTRA-THIN; VAN DER WAALS;

DEFORMATION; LINEARIZATION; LIQUID FILMS; SURFACE PROPERTIES; TEMPERATURE DISTRIBUTION; VAN DER WAALS FORCES;

SURFACE TENSION;

EID: 79958773599     PISSN: 09467076     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00542-011-1223-0     Document Type: Conference Paper

References (9)

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2. Israelachvili JN (1992) Intermolecular and surface forces, 2nd edn. Academic Press, London
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