The Design and Test Cost Problem

IEEE Design and Test of Computers

Volumn 18, Issue 6, 2001, Pages 6-

  Maly, Wojciech ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

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EID: 79958289335     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2001.970415     Document Type: Article

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