Characterization and modeling of integrated photosensors in standard CMOS technology

European Solid-State Device Research Conference

Volumn , Issue , 1996, Pages 735-738

  Baureis, Peter ^a   Gerber, Johannes ^b  

^a SIEMENS AG   (Germany)

^b FRAUNHOFER INSTITUTE FOR INTEGRATED CIRCUITS IIS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTO-SENSORS; STANDARD CMOS TECHNOLOGY;

EID: 79958266432     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)

1. M. Koolen et al, proceedings on IEEE BCTM 1991, pp. 188-191.