Electron optics of spheroid charged particle energy analyzers

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 645, Issue 1, 2011, Pages 234-240

  Cubric, D ^a   Kholine, N ^b   Konishi, I ^c  

^a Shimadzu Research Laboratory   (United Kingdom)

^b INSTITUTE FOR ANALYTICAL INSTRUMENTATION   (Russian Federation)

^c SHIMADZU CORPORATION   (Japan)

Author keywords

Auger electron spectroscopy; Electron optics; Energy analyzer; Order of focusing; Photoelectron spectroscopy

Indexed keywords

CHARGED PARTICLES; ELECTRON OPTICS; FOCUSING; PHOTOELECTRON SPECTROSCOPY;

ENERGY ANALYZER; ENERGY RESOLUTIONS; HIGH-ORDER; PARTICLE ENERGY; RELATIVE ENERGIES; VERY HIGH ENERGIES;

AUGER ELECTRON SPECTROSCOPY;

EID: 79958220280     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.12.090     Document Type: Conference Paper

References (6)

1. D. Roy, and D. Tremblay Rep. Prog. Phys. 53 1990 1621
2. N. Kholine, D. Cubric, I. Konishi, PCT Patent no. WO 2009/053666 A2.
3. P.W. Hawkes, and E. Kasper Principles of Electron Optics vol. 2 1996 Academic Press pp. 893-903
4. K. Siegbahn, N. Kholine, and G. Golikov Nucl. Instr. and Meth A 384 1997 563
5. D.A. Dahl, SIMION 3D, version 7.0, 2000.
6. CPO programs, free versions available at < http://www.electronoptics. com >.