High quality ZnO and Ga:ZnO thin films grown onto crystalline Si (1 0 0) by RF magnetron sputtering

Solar Energy Materials and Solar Cells

Volumn 95, Issue 8, 2011, Pages 2327-2334

  Gabas M ^a   Diaz Carrasco P ^a   Agullo Rueda F ^b   Herrero, P ^b   Landa Canovas A R ^b   Ramos Barrado, J R ^a  

^a UNIVERSITY OF MÁLAGA   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

Ga doped ZnO; Microstructural characterization; Silicon solar cells; Transparent conductive oxides

Indexed keywords

AMORPHOUS SILICA; CARRIER TRAPS; CRYSTALLINE SI; DOPED FILMS; DOPED SAMPLE; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL CONDUCTIVITY; GA-DOPED; GA-DOPED ZNO; GRAIN SIZE; HIGH QUALITY; MICRO-STRUCTURAL CHARACTERIZATION; OPTICAL MEASUREMENT; ORDERS OF MAGNITUDE; PHOTO-ELECTRONIC DEVICES; RAMAN MICROSPECTROSCOPY; RF-MAGNETRON SPUTTERING; SI SOLAR CELLS; SINGLE-CRYSTAL SI; SUBSTITUTIONAL IMPURITIES; TRANSPARENT CONDUCTING ELECTRODES; TRANSPARENT CONDUCTIVE OXIDES; VISIBLE SPECTRA; WURTZITE STRUCTURE; ZNO;

AMORPHOUS FILMS; CHARACTERIZATION; CRYSTAL IMPURITIES; CRYSTALLINE MATERIALS; DISPLAY DEVICES; ELECTRIC CONDUCTIVITY; GALLIUM ALLOYS; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNETRON SPUTTERING; METALLIC FILMS; OPTICAL DATA PROCESSING; OPTICAL PROPERTIES; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICA; SILICON; SILICON SOLAR CELLS; SILICON WAFERS; SINGLE CRYSTALS; SUBSTITUTION REACTIONS; SUBSTRATES; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE; ZINC SULFIDE;

CONDUCTIVE FILMS;

EID: 79958132046     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2011.04.001     Document Type: Article

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