High pressure x-ray diffraction measurements on Mg2SiO 4 glass

Journal of Non-Crystalline Solids

Volumn 357, Issue 14, 2011, Pages 2632-2636

  Benmore, C J ^a,b   Soignard, E ^b   Guthrie, M ^a,e   Amin, S A ^b   Weber, J K R ^a,c   McKiernan, K ^b   Wilding, M C ^d   Yarger, J L ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

^c MATERIALS DEVELOPMENT INC   (United States)

^d ABERYSTWYTH UNIVERSITY   (United Kingdom)

^e GEOPHYSICAL LABORATORY   (United States)

Author keywords

Equation of state; Glass structure; High pressure; Silicate glass; X ray diffraction

Indexed keywords

AMBIENT PRESSURES; COORDINATION NUMBER; EQUATION OF STATE; GLASS STRUCTURE; HIGH ENERGY X-RAY DIFFRACTION; HIGH PRESSURE; MOLECULAR DYNAMICS SIMULATIONS; PAIR DISTRIBUTION FUNCTIONS; SILICATE GLASS; STRUCTURE FACTORS; X-RAY DIFFRACTION MEASUREMENTS;

DIFFRACTION; DISTRIBUTION FUNCTIONS; EQUATIONS OF STATE OF LIQUIDS; MOLECULAR DYNAMICS; SILICATES; X RAY DIFFRACTION;

GLASS;

EID: 79958078845     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2010.12.064     Document Type: Conference Paper

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