Synthesis and characterisation of Fe-Pt and Co-Fe-Pt nanocrystalline magnetic thin films electrodeposited from tartrate-alkaline electrolyte solution

Materials Research Innovations

Volumn 15, Issue 3, 2011, Pages 196-201

  Teh, S H ^a   Yaacob, I I ^b  

^a UNIVERSITY OF MALAYA   (Malaysia)

^b INTERNATIONAL ISLAMIC UNIVERSITY MALAYSIA   (Malaysia)

Author keywords

Co Fe Pt; Electrodeposition; Fe Pt; Nanocrystalline; Thin films

Indexed keywords

ALLOY FILM; ALTERNATING GRADIENT MAGNETOMETER; AMMONIA SOLUTION; BRASS SUBSTRATES; CHARACTERISATION; CO CONTENT; CO-FE-PT; COBALT CONTENT; CODEPOSITION; COERCIVITIES; CRYSTALLOGRAPHIC STRUCTURE; ELECTROLYTE SOLUTIONS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FACE-CENTRED CUBIC; FE-PT; GRANULE SIZE; HIGHER DIFFRACTION; MAGNETIC FORCE; MAGNETISATION; NANOCRYSTALLINE; NANOCRYSTALLINE THIN FILMS; NANOCRYSTALLINES; PLATING BATH; PLATINUM COMPLEXES; XRD; XRD-PEAK BROADENING;

AMMONIUM COMPOUNDS; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; COBALT COMPOUNDS; CRYSTALLITE SIZE; DIFFRACTION; ELECTROLYTES; ELECTROPLATING; GRANULATION; IRON ALLOYS; MAGNETIC FORCE MICROSCOPY; MAGNETIC PROPERTIES; MAGNETIC THIN FILMS; MAGNETISM; MAGNETOMETERS; MEASUREMENT THEORY; MICROSTRUCTURE; PLATINUM; PLATINUM ALLOYS; PLATINUM COMPOUNDS; SATURATION MAGNETIZATION; SCANNING ELECTRON MICROSCOPY; SURFACE MORPHOLOGY; SURFACE PROPERTIES; SURFACE ROUGHNESS; THIN FILMS; TOPOGRAPHY; X RAY DIFFRACTION; X RAY SPECTROSCOPY; X RAYS;

COBALT;

EID: 79958016380     PISSN: 14328917     EISSN: None     Source Type: Journal    
DOI: 10.1179/143307511X13018917925757     Document Type: Article

References (20)

1. D. H. Wei, C. C. Yu, S. C. Fong, F. T. Yuan, H. W. Chang, K. L. You, Y. Liou, T. S. Chin and Y. D. Yao: IEEE Trans. Magn., 2007, 43, (6).
2. T. Seki, T. Shima, K. Takanashi, Y. Takanashi, E. Matsubara and K. Hono: IEEE Trans. Magn., 2004, 40, (4), 2522-2524.
3. F. Wang, K. Hosoiri, S. Doi, N. Okamoto, T. Kuzushima, T. Totsuka and T. Watanabe: Electrochem. Commun., 2004, 6, 1149-1152.
4. M. Abes, J. Venuat, D. Muller, A. Carvalho, G. Schmerber, E. Beaurepaire, A. Dinia and V. Pierron-Bohnes: Catal. Today, 2006, 113, 245-250.
5. C. N. R. Rao, A. Muller and A. K. Cheetham: 'The chemistry of nanomaterials', Vol. 1, 1; 2004, Weinheim, Wiley-VCH Verlag GmbH & Co.
6. I. Zana, G. Zangari and M. Shamsuzzoha: J. Magn. Magn. Mater., 2005, 292, 266-280.
7. K. Zuzek Kozman, A. Krause, K. Leistner, S. Fahler, L. Schultz and H. Schlorb: J. Magn. Magn. Mater., 2007, 314, 116-121.
8. Y. F. Ding, J. S. Chen and E. Liu: Thin Solid Films, 2005, 474, 141-145.
9. H. L. Ge, G. Y. Wei, Q. Wu, Q. Y. Zhou and X. Y. Wang: J. Iron. Steel Res. Int., 2007, 14, (4), 65-68.
10. H. S. Nalwa: 'Nanostructured materials and nanotechnology', Vol. 1,1; 2002, Maryland Heights, MO, Academic Press.
11. F. Wang, S. Doi, K. Hosoiri and T. Watanabe: Mater. Sci. Eng. A, 2004, A375-A377, 1289-1293.
12. G. Pattanaik, D. M. Kirkwood, X. L. Xu and G. Zangari: Electrochim. Acta, 2007, 52, 2755-2764.
13. D. A. Skoog, D. M. West and F. J. Holler: 'Fundamental of analytical chemistry', 7th edn, A13-A14; 1996, Philadelphia, PA, Saunders College Publishing.
14. I. Shigeru, U. Miki and D. Tohru: IEEE Trans. Magn., 2005, 41, (10), 3349-3351.
15. S. H. Teh and I.I. Yaacob: Mater. Res. Innov., 2009, 13, (3), 199-202.
16. G. Weo, H. L. Ge, L. H. Huang, Q. Wu, Q. Q. Wang and L. M. Huang: Appl. Surf. Sci., 2008, 254, 3425-3430.
17. Y. C. Lai, Y. H. Chang and Y. K. Chen: Thin Solid Films, 2004, 469-470, 290-294.
18. A. Hadi and I. I. Yaacob: Mater. Lett., 2007, 61, 93-96.
19. M. H. Koay and I. I. Yaacob: J. Mater. Process. Technol., 2007, 191, 48-50.
20. S. Jeong, Y. N. Hsu, D. E. Laughlin and M. E. Henry: IEEE Trans. Magn., 2001, 37, (4), 1299-1301.