Approximate reliability function based on wavelet latin hypercube sampling and bee recurrent neural network

IEEE Transactions on Reliability

Volumn 60, Issue 2, 2011, Pages 404-414

  Yeh, Wei Chang ^a   Su, Jack C P ^a   Hsieh, Tsung Jung ^a   Chih, Mingchang ^a   Liu, Sin Long ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Artificial bee colony algorithm; bee recurrent neural network; Monte Carlo simulation; wavelet latin hypercube sampling; wavelet transform

Indexed keywords

APPROXIMATE MODEL; ARTIFICIAL BEE COLONIES; BEE RECURRENT NEURAL NETWORK; BLACK BOXES; LATIN HYPERCUBE SAMPLING; LIMITED SPACE; MONTE CARLO SIMULATION; NETWORK RELIABILITY; NEURAL NETWORK PARAMETERS; RELIABILITY FUNCTIONS; TRAINING DATA; WAVELET LATIN HYPERCUBE SAMPLING;

ALGORITHMS; COMPUTER SIMULATION; GEOMETRY; METADATA; MONTE CARLO METHODS; RELIABILITY; WAVELET TRANSFORMS;

RECURRENT NEURAL NETWORKS;

EID: 79957974864     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2011.2134190     Document Type: Article

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