XPS study of adsorption and desorption of a Bi thin film on the five-fold icosahedral Al-Pd-Mn surface

Philosophical Magazine

Volumn 91, Issue 19-21, 2011, Pages 2889-2893

  Young, K M ^a   Cross, N ^a   Smerdon, J A ^a,c   Dhanak, V R ^a   Sharma, H R ^a   Lograsso, T A ^b   Ross, A R ^b   McGrath, R ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

^b IOWA STATE UNIVERSITY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

adsorption; aluminium palladium manganese; bismuth; quasicrystal; scanning tunnelling microscopy; surface; X ray photoelectron spectroscopy

Indexed keywords

AL-PD-MN; ALUMINIUM-PALLADIUM-MANGANESE; ANNEALING TEMPERATURES; BI THIN FILMS; SCANNING TUNNELLING MICROSCOPY; STM STUDY; TEMPERATURE RANGE; THERMAL STABILITY; XPS;

ADSORPTION; BISMUTH; DESORPTION; FILM GROWTH; FILM PREPARATION; MANGANESE; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTONS; QUASICRYSTALS; SCANNING TUNNELING MICROSCOPY; THERMODYNAMIC STABILITY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ALUMINUM;

EID: 79957822713     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786435.2010.536793     Document Type: Article

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