Fabrication of a nanostructure thermal property measurement platform

Nanotechnology

Volumn 22, Issue 27, 2011, Pages

  Harris, C T ^a,b   Martinez, J A ^a   Shaner, E A ^a   Huang, J Y ^a   Swartzentruber, B S ^a   Sullivan, J P ^a   Chen, G ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE STRUCTURES; ATOMIC STRUCTURE; GAN NANOWIRES; IN-SITU; MICROFABRICATED; MODEL STUDY; NANOMANIPULATORS; ONE-DIMENSIONAL NANOSTRUCTURE; PROCESSING STEPS; SCANNING ELECTRON MICROSCOPE; TEM; TEM CHARACTERIZATION; TEST SAMPLES; THERMAL PROPERTY MEASUREMENTS; THERMAL TRANSPORT PROPERTIES; THROUGH HOLE;

ATOMS; DEFECTS; ELECTRIC PROPERTIES; ELECTRIC WIRE; GALLIUM NITRIDE; NANOWIRES; SCANNING ELECTRON MICROSCOPY; STACKING FAULTS; STRUCTURAL PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES;

THERMAL CONDUCTIVITY;

EID: 79957807929     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/27/275308     Document Type: Article

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