Transition from axial to planar surface channeling for fast atom diffraction

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 269, Issue 11, 2011, Pages 1212-1215

  Seifert, J ^a   Schuller A ^a   Winter, H ^a   Gartner K ^b  

^a HUMBOLDT UNIVERSITY   (Germany)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

Fast atom diffraction; Insulator surface; Surface channeling

Indexed keywords

ATOM DIFFRACTION; AZIMUTHAL ANGLE; AZIMUTHAL ROTATION; DIFFRACTION ORDERS; GRAZING ANGLE OF INCIDENCE; HE ATOMS; INSULATOR SURFACE; PAIR POTENTIAL; PLANAR SURFACE; SEMICLASSICAL APPROACHES; SINGLE PEAK; SURFACE CHANNELING; SURFACE INTERACTIONS; TARGET SURFACE;

ANGULAR DISTRIBUTION; DIFFRACTION PATTERNS; INTERFEROMETRY;

ATOMS;

EID: 79957755787     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.11.050     Document Type: Article

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