Integrated polarization analyzing CMOS image sensor for material classification

IEEE Sensors Journal

Volumn 11, Issue 8, 2011, Pages 1692-1703

  Sarkar, Mukul ^a,b   San Segundo Bello, David San Segundo ^c   Van Hoof, Chris ^c   Theuwissen, Albert ^b,d  

^a IMEC   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c IMEC   (Belgium)

^d Harvest Imaging   (Belgium)

Author keywords

degree of polarization; Fresnel reflection coefficients; image sensor; material classification; polarization; stokes parameters; wire grid polarizer

Indexed keywords

DEGREE OF POLARIZATION; FRESNEL REFLECTION COEFFICIENT; MATERIAL CLASSIFICATION; STOKES PARAMETERS; WIRE GRID POLARIZER;

CMOS INTEGRATED CIRCUITS; COMPUTER APPLICATIONS; COMPUTER VISION; DIGITAL CAMERAS; IMAGE SENSORS; LIGHT REFLECTION; OPTICAL INSTRUMENTS; PIXELS; REFLECTION; SENSORS; SURFACES; WIRE;

POLARIZATION;

EID: 79957741006     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2010.2095003     Document Type: Article

References (15)

1. G. Klinker, S. Shafer, and T. Kanade, "Using a color reflection model to separate highlights from object color," in Proc. IEEE 1st Int. Conf. Comput. Vis., 1987, pp. 145-150. (Pubitemid 17613820)
2. S. Shafer, "Using color to separate reflection components," Color Res. Applicat., vol. 10, pp. 210-218, 1985. (Pubitemid 16520383)
3. G. Healey and W. E. Blanz, "Identifying metal surfaces in color images," in Proc. SPIE Conf. Opt., Electro-Opt., Sens., 1988.
4. G. Healey and T. O. Binford, "Predicting material classes," in Proc. DARPA Image Understanding Workshop, 1988, pp. 1140-1146.
5. L. B. Wolff, "Polarization based material classification from specular reflection," IEEE Trans. Pattern Anal. Mach. Intell., vol. 12, no. 11, pp. 1059-1071, Nov. 1990.
6. H. Chen and L. Wolff, "Polarization phase based method for material classification and object recognition in computer vision," Int. J. Comput. Vis., vol. 28, no. 1, pp. 45-56, 1999.
7. E. Hchet and A. Zajak, Optics, 3rd ed. London, U.K.: Longman, Addison- Wesley, 1988.
8. D. D. Malacara, Physical Optics and Light Measurements. San Diego, CA: Academic, 1989, p. 157.
9. T. Tokuda, H. Yamada, H. Shimohata, K. Sasagawa, and J. Ohta, "Polarization- analyzing CMOS image sensor with embedded wire grid polarizer," in Proc. Int. Image Sens. Workshop, 2009.
10. T. Tokuda, H. Yamada, K. Sasagawa, and J. Ohta, "Polarization- analyzing CMOS image sensor using monolithically embedded polarizer for microchemistry system," in Proc. IEEE Int. Symp. Circuits Syst., 2009, pp. 313-316.
11. V. Gruev, J. van der Spiegel, and N. Engheta, "Advances in integrated polarization imaging sensors," in Proc. IEEE/NIH LiSSA Workshop, 2009, pp. 62-65.
12. G. S. Smith, An Introduction to Classical Electromagnetic Radiation. Cambridge, U.K.: Cambridge Univ. Press, 1997.
13. S. Tominaga and A. Kimachi, "Polarization imaging for material classification," Opt. Eng., vol. 47, no. 12, pp. 123-201, 2008.
14. J. N. Damask, Polarization Optics in Telecommunications. New York: Springer, 2005, p. 22.
15. R. Siegal and J. R. Howell, Thermal Radiation Heat Transfer. New York: McGraw-Hill, 1981.