Ellipsometry as a nondestructive depth profiling tool for roll-to-roll manufactured flexible solar cells

Journal of Physical Chemistry C

Volumn 115, Issue 21, 2011, Pages 10817-10822

  Madsen, Morten V ^a   Sylvester Hvid, Kristian O ^a   Dastmalchi, Babak ^b   Hingerl, Kurt ^b   Norrman, Kion ^a   Tromholt, Thomas ^a   Manceau, Matthieu ^a   Angmo, Dechan ^a   Krebs, Frederik C ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; BLEND COMPOSITION; BULK HETEROJUNCTION; COATING PROCEDURES; DEVICE GEOMETRIES; EFFECTIVE MEDIUM APPROXIMATION MODELS; FILM MORPHOLOGY; FLEXIBLE SOLAR CELLS; FLEXIBLE SUBSTRATE; LINE SCAN; LINEAR GRADIENTS; MODEL PARAMETERS; NON DESTRUCTIVE; OPTICAL DISPERSION; OPTICAL SIMULATION; OPTICAL TRANSMISSIONS; QUALITY TESTING; ROLL TO ROLL; UV VISIBLE SPECTROSCOPY; VARYING THICKNESS; XPS DEPTH PROFILING;

COATINGS; COMPUTER SIMULATION; DIES; ELLIPSOMETRY; HETEROJUNCTIONS; LIGHT TRANSMISSION; PHASE SEPARATION; SOLAR CELLS; ULTRAVIOLET SPECTROSCOPY;

DEPTH PROFILING;

EID: 79957670169     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp2004002     Document Type: Article

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