Filter-less amplification for rapid swept-wavelength interferometric measurement of silicon waveguide group delay statistics

IEEE Photonics Technology Letters

Volumn 23, Issue 12, 2011, Pages 783-785

  Cooper, Michael L ^a   Schneider, Mark A ^a   Gupta, Greeshma ^a   Mookherjea, Shayan ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Integrated nanophotonic systems; optical interconnects; silicon nanophotonics; waveguide devices

Indexed keywords

DELAY STATISTICS; DISPERSION PROPERTIES; FILTER-LESS; GROUP DELAY RIPPLES; HIGH RESOLUTION; INTEGRATED NANOPHOTONIC SYSTEMS; INTERFEROMETRIC MEASUREMENT; NANOPHOTONIC DEVICES; OPTICAL AMPLIFICATIONS; SCALING BEHAVIOR; SILICON WAVEGUIDE; STATISTICAL DISTRIBUTION; WAVEGUIDE DEVICES;

AMPLIFICATION; INTERFEROMETRY; NANOPHOTONICS; OPTICAL INTERCONNECTS; WAVEGUIDES;

GROUP DELAY;

EID: 79957666620     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2011.2134842     Document Type: Article

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