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Volumn 50, Issue 5 PART 3, 2011, Pages

Spectroscopic ellipsometry studies of CdS:O layers for solar cells

(9) Shim, Yong Gu a Sakamoto, Junichi a Suzuki, Akinori b Khalilova, Khuraman c Wakita, Kazuki b Mamedov, Nazim c Bayramov, Ayaz c Huseynov, Emil c Hasanov, Ilham c

a Osaka Prefecture University (Japan)

b CHIBA INSTITUTE OF TECHNOLOGY (Japan)

c INSTITUTE OF PHYSICS (Azerbaijan)

Author keywords

[No Author keywords available]

Indexed keywords

BLUE SHIFT; CDS; CDS FILMS; CDS THIN FILMS; DIELECTRIC FUNCTION SPECTRA; DIELECTRIC FUNCTIONS; GLASS SUBSTRATES; MAIN STRUCTURE; PHOTON ENERGY RANGE; RF-SPUTTERING; ROOM TEMPERATURE; SOLAR-CELL APPLICATIONS; SPECTRAL RANGE;

CADMIUM SULFIDE; NANOSTRUCTURED MATERIALS; OXYGEN; REGRESSION ANALYSIS; SOLAR CELLS; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; THIN FILMS;

CADMIUM COMPOUNDS;

EID: 79957625400 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.50.05FC14 Document Type: Article

Times cited : (9)

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