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Volumn 257, Issue 17, 2011, Pages 7405-7410

Novel microstructural growth in the surface of Inconel 625 by the addition of SiC under electron beam melting

Author keywords

Electron beam method; Energy dispersive X ray spectroscopy (EDXS); Hardness; Microstructure; Scanning electron microscopy (SEM); X ray diffraction (XRD)

Indexed keywords

3D PRINTERS; CRYSTAL ATOMIC STRUCTURE; ELECTRON BEAM MELTING; ELECTRON BEAMS; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; HARDENING; HARDNESS; MICROSTRUCTURE; NICKEL ALLOYS; NICKEL COMPOUNDS; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; SURFACE TREATMENT; X RAY DIFFRACTION;

EID: 79957480738     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.02.067     Document Type: Article
Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.