Ambient seismic noise eikonal tomography for near-surface imaging at Valhall

Leading Edge (Tulsa, OK)

Volumn 30, Issue 5, 2011, Pages 506-512

  De Ridder, Sjoerd ^a   Dellinger, Joe ^b  

^a STANFORD UNIVERSITY   (United States)

^b BP AMERICA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GEOLOGY;

ACTIVE SEISMIC; AMBIENT SEISMIC NOISE; NEAR SURFACES; PASSIVE ENERGY; SEISMIC DATAS; SEISMIC IMAGING; SEISMIC INTERFEROMETRIES; SUBSURFACE STRUCTURES;

SEISMOLOGY;

IMAGING METHOD; INTERFEROMETRY; NUMERICAL MODEL; SEISMIC DATA; SEISMIC NOISE; TOMOGRAPHY;

ATLANTIC OCEAN; NORTH SEA; VALHALL FIELD;

EID: 79957461773     PISSN: 1070485X     EISSN: None     Source Type: Journal    
DOI: 10.1190/1.3589108     Document Type: Article

References (13)

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