High-temperature stability of α-Ta4AlC3

Materials Research Bulletin

Volumn 46, Issue 7, 2011, Pages 1088-1091

  Lane, Nina J ^a   Eklund, Per ^b   Lu, Jun ^b   Spencer, Charles B ^a   Hultman, Lars ^b   Barsoum, Michel W ^a  

^a Drexel University   (United States)

^b LINKÖPING UNIVERSITY   (Sweden)

Author keywords

C. X ray diffraction (XRD); Polymorphic; Transmission electron microscopy (TEM)

Indexed keywords

CHARACTERISTIC X RAYS; FIRST-PRINCIPLES; HIGH TEMPERATURE; HIGH TEMPERATURE STABILITY; POLYMORPHIC;

DIFFRACTION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

PHASE STABILITY;

EID: 79956372552     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2011.03.005     Document Type: Article

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