Condition recognition of complex systems based on multi-fractal analysis

Proceedings - Annual Reliability and Maintainability Symposium

Volumn , Issue , 2011, Pages

  Lui, Yanqing ^a   Gao, Jianmin ^a   Jiang, Hongquan ^a   Chen, Kun ^a  

^a XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Condition recognition; Dempster Shafer evidence theory; Multifractal analysis

Indexed keywords

ABNORMAL CONDITIONS; COMPLEX SYSTEMS; CONDITION RECOGNITION; DATA SETS; DEMPSTER-SHAFER EVIDENCE THEORY; IN-PROCESS; INTRINSIC CHARACTERISTICS; MONITORING TIME; MULTI FRACTALS; MULTI-FRACTAL SPECTRUM; MULTI-SOURCE INFORMATION FUSION; MULTICHANNEL DATA; MULTIFRACTAL ANALYSIS; MULTIFRACTAL DETRENDED FLUCTUATION ANALYSIS; NON-LINEARITY; NONLINEAR FEATURES; OBSERVED DATA; PROCESS INDUSTRIES; SCALE INVARIANCE; SELF-SIMILARITIES; SYSTEM SAFETY; TRADITIONAL TECHNIQUES;

CHEMICAL PLANTS; COMPUTER SIMULATION; FEATURE EXTRACTION; FRACTALS; LARGE SCALE SYSTEMS; MAINTAINABILITY; RELIABILITY ANALYSIS; TIME SERIES; TIME SERIES ANALYSIS;

SPECTRUM ANALYSIS;

EID: 79956338788     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2011.5754454     Document Type: Conference Paper

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